xrf gold testing machine

  xrf gold testing machine -Precious Metal Recycling Solutions

1： Precise Identification Technology Solves Industry Challenges-xrf gold testing machine

In the precious metals recycling industry, such as gold and platinum, the precision of detection technology is key to ensuring business success. In recent years, criminals have exploited flaws in traditional spectrometers, especially those relying on empirical algorithms and unable to detect elements like rhenium and tungsten without standard samples, leading to a significant influx of adulterated materials and scrap into the market, causing huge losses for precious metal recyclers.

Facing this challenge, the identification of mixed materials during the recycling process is particularly important. Merchants should avoid purchasing materials with black spots on the surface, or should test by melting or cutting before purchase to significantly reduce risks. For all samples, regardless of their rhenium and tungsten content, whether on the surface or the cross-section, careful testing should be conducted. However, with the CDOCAST spectrometer, whether it’s materials with higher or lower contents of rhenium and tungsten, whether mixed on the surface or cut open, none can hide from our instrument, which is why we recommend our spectrometer to recyclers.

Traditional instruments have obvious flaws in detecting low-content rhenium and tungsten materials due to their low resolution, unable to accurately identify them. Therefore, choosing detectors with high resolution, such as Si-Pin/Fast SDD, becomes a priority within the industry. Moreover, to address the issue of rhenium’s characteristic peaks being easily interfered with by gold, it is recommended to use instruments with the FP algorithm. Compared to traditional deconvolution algorithms,the FP algorithm combines spectral fitting and calculation by fitting the full spectrum, enabling precise analysis of element content even in the presence of multiple elements’ interference, effectively identifying elements like rhenium and tungsten.

2：How is XRF (X-ray Fluorescence) technology utilized in Precious Metal Analyzer?

X-ray Fluorescence (XRF) is a powerful non-destructive analytical technique utilized for determining the elemental composition of various materials. By measuring the fluorescent X-rays emitted from a sample when it is stimulated by a primary X-ray source, XRF analyzers can accurately unveil the chemistry of the sample at hand. Each element within a sample emits a unique set of characteristic fluorescent X-rays, akin to a fingerprint, making XRF spectroscopy ideal for both qualitative and quantitative analysis of material composition.

(1) The XRF Spectroscopy-(xrf gold testing machine) Procedure

The process of X-ray fluorescence involves irradiating a sample with high-energy X-rays generated by a controlled X-ray tube. These X-rays interact with atoms in the sample, causing the dislodgment of electrons from the inner orbital shells of the atoms. Subsequently, as the atoms stabilize by filling the resulting vacancies in the inner shells with electrons from higher energy states, fluorescent X-rays are emitted during the electron transitions to lower energy levels. These emitted X-rays bear energies specific to the elemental composition of the sample, essentially acting as a unique identifier for each element. By precisely measuring the energy of these fluorescent X-rays, XRF spectroscopy enables both qualitative and quantitative determination of material composition.

Applications of XRF Metal Analyzers in the Jewelry Industry

The jewelry industry heavily relies on XRF technology for the analysis and authentication of precious metals. XRF metal analyzers are widely used

in jewelry manufacturing, quality control, and retail operations to ensure that the materials used meet specific purity levels and standards.

(2) Applications of XRF Metal Analyzers in the Jewelry& Recycle Industry

1. Jewelry Recycling

2. Jewelry Shops
3. Jewelry Factories
4. Precious Metal Ore Analysis
5. Purification Processes.

3: Proportional Counter Tube / Si-Pin Detector/ SDD Detector in XRF Metal Analyzer?

Generally, XRF (X-ray fluorescence) metal analyzers come equipped with one of two types of detectors: proportional counters or semiconductor-based detectors. In the category of semiconductor options, these analyzers often feature two main types: Silicon Drift Detectors (SDD) and Silicon-PIN (Si-Pin Detector) detector.

1: Overview of Proportional Counter Tube, Si-Pin Detector, and SDD detector

(1): Proportional Counter Tube

A proportional counter stands as a pivotal instrument within the realm of gaseous ionization detectors, serving a wide array of scientific and industrial purposes. These range from radiation detection and nuclear physics to elemental analysis. At its heart lies a fundamental operation: utilizing an electric field to detect and quantify ionizing radiation, offering precise insights into the invisible forces at play.

(2): SI-PIN detector (Silicon-Pin Detector)

Silicon-Pin detectors(SI-PIN detector) operate by transforming incident X-rays from a sample into electron-hole pairs in silicon material. Under an applied electric field, these charge carriers migrate towards the electrodes of the detector, producing an electric current that correlates with the X-ray energy. This current is subsequently converted into a voltage signal, enabling the identification and quantification of elements in X-ray fluorescence analysis with greater precision.

(3): SDD (Silicon Drift Detector)

Silicon Drift Detectors (SDD) function by transforming incoming X-rays from a specimen into electron-hole pairs within a silicon semiconductor. An electric field then directs these charge carriers to the electrodes of the detector, producing a current that corresponds to the energy of the X-ray. This current is subsequently converted into a voltage signal, facilitating the accurate analysis of the X-ray spectrum. It enables the identification and quantification of elements in X-ray fluorescence analysis with unparalleled sensitivity and resolution.

In essence, while both SDDs and Si-PIN detectors are semiconductor-based X-ray detectors, their distinct construction and operational mechanisms lead to different performance outcomes. SDDs tend to provide higher sensitivity, improved resolution, and quicker analyses. However, the selection between them should be informed by the specific needs of the application, as each detector type comes with its own set of advantages and challenges.

4: The influence of optical path innovation on the non-destructive testing sector for precious metals

The angle of X-ray incident on the sample is different.

Using various incident angles shows minimal difference in performance for standard samples. However, the impact is significantly larger on samples with coatings, curved surfaces, and in detecting concave

positions. The xrf gold testing machine spectrometer test demands samples to be as uniform and flat as possible, despite often encountering a diverse range of samples. Therefore, particularly under the same collimator size and more so with smaller collimators, employing a method where the x-ray directly hits the sample vertically proves to be a superior approach for samples not aligned straight.

This vertical incidence approach not only enhances the accuracy of measurements for irregularly shaped samples but also minimizes the scatter effect, which can significantly distort results. By directing the X-ray perpendicularly to the sample surface, it ensures a more consistent and concentrated interaction zone, thereby reducing the likelihood of signal dispersion associated with angled incidence techniques. Consequently, this method reveals a critical advancement in the sensitivity and reliability of precious metal assays, especially for complex geometries. Furthermore, the uniform application of X-rays in vertical incidence setups facilitates a more streamlined analysis process, reducing the need for multiple sample preparations and adjustments. This, in turn, accelerates throughput and enhances the operational efficiency of non-destructive testing operations in the precious metals sector.

5: The Impact of Various Collimators on Identical Samples

When conducting XRF technology analysis, choosing the appropriate collimator size is crucial as it directly affects the accuracy of the analysis test. The size of the collimator determines the diameter and focus of the X-ray beam, with the key being to balance spatial resolution, sensitivity, and detection depth to meet different testing needs.

Using a smaller collimator can produce a more concentrated beam, greatly improving the spatial resolution and surface sensitivity of the test, making it highly suitable for small samples or samples requiring localized analysis, and can achieve more precise test results. However, small collimators also have their limitations, such as a significantly reduced count rate under the same high voltage and tube current conditions, which may affect the stability and accuracy of the test.

Conversely, larger collimators, although capable of covering a broader area, facilitating the detection of signals from multiple elements

2. simultaneously, can also cause mutual interference between signals, affecting the accuracy of elemental content analysis. For example, when analyzing the 18K gold in a platinum ring setting, using a large collimator may detect signals from both gold and platinum simultaneously, leading to inaccurate analysis.Therefore, choosing a collimator of the appropriate size according to the specific requirements of the test is very critical. For applications requiring high spatial resolution and surface sensitivity for small sample sizes or coating thickness testing, a small collimator is preferred. For applications needing broad coverage and simultaneous multi-element analysis, a larger collimator might be more suitable.In conducting XRF analysis, understanding the impact of collimator size on test results can help users choose the most appropriate collimator to obtain the most accurate analysis results. Whether it’s a small or large collimator, the key is how they meet specific testing needs to improve the accuracy and efficiency of the analysis.
   

   6: Detection capabilities and limitations of  xrf gold testing machine : Which elements cannot be detected?

   XRF analyzers are advanced detection tools widely used in the field of material analysis. However, XRF technology has its limitations, especially in detecting some of the lightest elements on the periodic table. Specifically, XRF analyzers cannot detect elements lighter than magnesium, such as hydrogen, carbon, nitrogen, oxygen, and sodium. This is because the X-ray signals emitted by these elements are too weak to be effectively captured and counted by the detector. Therefore, while XRF analyzers can provide valuable information about the types and concentrations of elements present in a sample, they cannot provide detailed information about the sample’s chemical structure. Understanding these detection limitations of XRF analyzers is crucial for researchers and technicians when selecting the appropriate material analysis method.

   In summary, with technological advancements, the precious metal recycling industry is facing opportunities for transformation and upgrading. By adopting advanced detection technologies and instruments, recyclers can effectively avoid the risks of adulteration, ensuring the accuracy and safety of their business. This not only improves the efficiency and accuracy of precious metal recycling but also lays a foundation for the healthy development of the entire industry.